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Force-gradient sensitive Kelvin probe force microscopy by dissipative electrostatic force modulation
Miyahara, Yoichi, Grutter, PeterVolume:
110
Langue:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4981937
Date:
April, 2017
Fichier:
PDF, 4.44 MB
english, 2017