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SPIE Proceedings [SPIE Electron Technology Conference ELTE 2016 - Wisla, Poland (Sunday 11 September 2016)] Electron Technology Conference 2016 - A fully differential OTA with dynamic offset cancellation in 28nm FD-SOI process
Swatowska, Barbara, Maziarz, Wojciech, Pisarkiewicz, Tadeusz, Kucewicz, Wojciech, Jaworski, ZbigniewVolume:
10175
Année:
2016
Langue:
english
DOI:
10.1117/12.2261891
Fichier:
PDF, 542 KB
english, 2016