[IEEE 2017 Annual Reliability and Maintainability Symposium (RAMS) - Orlando, FL, USA (2017.1.23-2017.1.26)] 2017 Annual Reliability and Maintainability Symposium (RAMS) - Integrating degradation model with stress strength interference model to estimate reliability in design phase
Nandipati, Srikanth, Nichenametla, Amith Nag, Waghmare, Abhay LaxmanraoAnnée:
2017
Langue:
english
DOI:
10.1109/RAM.2017.7889747
Fichier:
PDF, 719 KB
english, 2017