[IEEE 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2016.7.18-2016.7.21)] 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Reliability and risk assessment from accelerated test result and field modeling: Delamination issue case study for automotive analog parts and sensors
Berges, Corinne, Feybesse, Adeline, Othman, Wan Abdul RahmanAnnée:
2016
DOI:
10.1109/ipfa.2016.7564314
Fichier:
PDF, 526 KB
2016