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[IEEE 2016 21st International Conference on Ion Implantation Technology (IIT) - Tainan, Taiwan (2016.9.26-2016.9.30)] 2016 21st International Conference on Ion Implantation Technology (IIT) - Electrical Deactivation of Boron in p+-Polycrystalline Silicon/SiOx/Crystalline Silicon Passivating Contacts for Silicon Solar Cells
Krugener, Jan, Tetzlaff, Dominic, Barnscheidt, Yvo, Larionova, Yevgeniya, Reiter, Sina, Turcu, Mircea, Wietler, Tobias, Peibst, Robby, Hohne, Uwe, Kahler, Jan-DirkAnnée:
2016
Langue:
english
DOI:
10.1109/IIT.2016.7882868
Fichier:
PDF, 461 KB
english, 2016