[IEEE 2016 74th Annual Device Research Conference (DRC) - Newark, DE, USA (2016.6.19-2016.6.22)] 2016 74th Annual Device Research Conference (DRC) - Atomically-thin HfSe2 transistors with native metal oxides
Mleczko, Michal J., Zhang, Chaofan, Lee, Hye Ryoung, Kuo, Hsueh-Hui, Magyari-Kope, Blanka, Shen, Zhi-Xun, Moore, Robert G., Fisher, Ian R., Nishi, Yoshio, Pop, EricAnnée:
2016
DOI:
10.1109/drc.2016.7548474
Fichier:
PDF, 546 KB
2016