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[IEEE 2016 IEEE Energy Conversion Congress and Exposition (ECCE) - Milwaukee, WI, USA (2016.9.18-2016.9.22)] 2016 IEEE Energy Conversion Congress and Exposition (ECCE) - A comprehensive study on variations of discrete IGBT characteristics due to package degradation triggered by thermal stress
Ali, Syed H., Dusmez, Serkan, Akin, BilalAnnée:
2016
Langue:
english
DOI:
10.1109/ECCE.2016.7854665
Fichier:
PDF, 633 KB
english, 2016