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[IEEE 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) - Pensacola Beach, FL, USA (2016.9.28-2016.9.30)] 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR) - Reliability of conformal coated surface mount packages
Yun Chen, Deng, Osterman, MichaelAnnée:
2016
Langue:
english
DOI:
10.1109/astr.2016.7762293
Fichier:
PDF, 428 KB
english, 2016