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Isothermal differential dilatometry based on X-ray analysis applied to stress relaxation in thin ion-beam-sputtered Pt films
Gruber, Wolfgang, Baehtz, Carsten, Geue, Thomas, Stahn, Jochen, Schmidt, HaraldVolume:
52
Langue:
english
Journal:
Journal of Materials Science
DOI:
10.1007/s10853-016-0458-7
Date:
February, 2017
Fichier:
PDF, 1.26 MB
english, 2017