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Mechanistic insights on the electronic properties and electronic/atomic structure aspects in orthorhombic SrVO 3 thin films: XANES–EXAFS study
Sharma, Aditya, Varshney, Mayora, Cheol Lim, Weon, Shin, Hyun-Joon, Pal Singh, Jitendra, Ok Won, Sung, Hwa Chae, KeunVolume:
19
Année:
2017
Langue:
english
Journal:
Phys. Chem. Chem. Phys.
DOI:
10.1039/c6cp08301c
Fichier:
PDF, 2.98 MB
english, 2017