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SPIE Proceedings [SPIE Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies 2016 - Constanta, Romania (Thursday 25 August 2016)] Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies VIII - Comparative shear tests of some low temperature lead-free solder pastes
Vladescu, Marian, Tamas, Razvan, Cristea, Ionica, Branzei, Mihai, Plotog, Ioan, Varzaru, Gaudentiu, Cucu, Traian C.Volume:
10010
Année:
2016
Langue:
english
DOI:
10.1117/12.2246106
Fichier:
PDF, 885 KB
english, 2016