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[IEEE 2016 IEEE 16th International Conference on Data Mining (ICDM) - Barcelona, Spain (2016.12.12-2016.12.15)] 2016 IEEE 16th International Conference on Data Mining (ICDM) - One-Pass Logistic Regression for Label-Drift and Large-Scale Classification on Distributed Systems
Nguyen, Vu, Nguyen, Tu Dinh, Le, Trung, Venkatesh, Svetha, Phung, DinhAnnée:
2016
Langue:
english
DOI:
10.1109/ICDM.2016.0145
Fichier:
PDF, 437 KB
english, 2016