SPIE Proceedings [SPIE Congress on Optics and Optoelectronics - Warsaw, Poland (Sunday 28 August 2005)] Photonics Applications in Industry and Research IV - Simulation of LDA and PDA measuring techniques in the nanometer particle size range
Vamos, Lenard, Romaniuk, Ryszard S., Simrock, Stefan, Jani, Peter, Lutkovski, Vladimir M.Volume:
5948
Année:
2005
Langue:
english
DOI:
10.1117/12.622913
Fichier:
PDF, 692 KB
english, 2005