SPIE Proceedings [SPIE International Conference on Optoelectronics and Microelectronics Technology and Application - Shanghai, China (Monday 10 October 2016)] International Conference on Optoelectronics and Microelectronics Technology and Application - A review on several key problems of standoff trace explosives detection by optical-related technology
Su, Yikai, Xie, Chongjin, Yu, Shaohua, Zhang, Chao, Lu, Wei, Capmany, Jose, Luo, Yi, Nakano, Yoshiaki, Hao, Yue, Yoshikawa, Akihiko, Zhuang, Songlin, Chen, Zhibin, Xiao, Cheng, Xiao, Wenjian, Qin, MenVolume:
10244
Année:
2017
Langue:
english
DOI:
10.1117/12.2258372
Fichier:
PDF, 716 KB
english, 2017