
Number of traps and trap depth position on statistical distribution of random telegraph noise in scaled NAND flash memory
Tomita, Toshihiro, Miyaji, KousukeVolume:
55
Langue:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.55.04EE08
Date:
April, 2016
Fichier:
PDF, 2.87 MB
english, 2016