SPIE Proceedings [SPIE The International Conference on Micro- and Nano-Electronics 2016 - Zvenigorod, Russian Federation (Monday 3 October 2016)] International Conference on Micro- and Nano-Electronics 2016 - GeSi nanocrystals formed by high temperature annealing of GeO/SiO 2 multilayers: structure and optical properties
Lukichev, Vladimir F., Rudenko, Konstantin V., Volodin, V. A., Cherkov, A. G., Vdovin, V. I., Stoffel, M., Rinnert, H., Vergnat, M.Volume:
10224
Année:
2016
Langue:
english
DOI:
10.1117/12.2266075
Fichier:
PDF, 3.55 MB
english, 2016