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An On-Chip Monitoring Circuit for Signal-Integrity Analysis of 8-Gb/s Chip-to-Chip Interfaces With Source-Synchronous Clock
Lee, Pil-Ho, Lee, Han-Yeol, Lee, Hyun-Bae, Jang, Young-ChanVolume:
25
Langue:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2016.2639289
Date:
April, 2017
Fichier:
PDF, 3.78 MB
english, 2017