SF6 decomposition of typical CT defect models
Ji, Shengchang, Zhong, Lipeng, Wang, Yuanyuan, Li, Jinyu, Cui, Yanjie, Wang, WeiVolume:
22
Langue:
english
Journal:
IEEE Transactions on Dielectrics and Electrical Insulation
DOI:
10.1109/TDEI.2015.004333
Date:
October, 2015
Fichier:
PDF, 1.10 MB
english, 2015