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[IEEE 2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS)] - Toyama, Japan (2016.6.26-2016.6.30)] 2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS) - Relationship between Al content of AlGaN buffer layer on top of initial AlN nucleation layer on Si and vertical leakage current of AlGaN/GaN high-electron-mobility transistor structures
Yamaoka, Yuya, Ito, Kazuhiro, Ubukata, Akinori, Yano, Yoshiki, Tabuchi, Toshiya, Matsumoto, Koh, Egawa, TakashiAnnée:
2016
Langue:
english
DOI:
10.1109/iciprm.2016.7528671
Fichier:
PDF, 698 KB
english, 2016