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Ultrafast-ultrafine probing of high-speed electrical waveforms using a scanning force microscope with photoconductive gating
J. Nees, S. I. Wakana, S. HamaVolume:
28
Langue:
english
Pages:
23
DOI:
10.1007/bf00820152
Date:
July, 1996
Fichier:
PDF, 2.08 MB
english, 1996