Results of an electron beam test with prototype silicon sensors manufactured by Infineon Technologies Austria AG
Treberspurg, W., Bartl, U., Bergauer, T., Dragicevic, M., Hacker, J., König, A., Wübben, T.Volume:
10
Langue:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/10/05/C05007
Date:
May, 2015
Fichier:
PDF, 535 KB
english, 2015