Low-Energy Electron Irradiation of NAND Flash Memories
Gadlage, Matthew J., Roach, Austin H., Labello, Jesse M., Halstead, Matthew R., Kay, Matthew J., Duncan, Adam R., Ingalls, James D., Bossev, Dobrin P., Rogers, James P.Année:
2016
Langue:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2016.2625698
Fichier:
PDF, 823 KB
english, 2016