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The effect of the displacement damage on the Charge Collection Efficiency in Silicon Drift Detectors for the LOFT satellite
Monte, E. Del, Evangelista, Y., Bozzo, E., Cadoux, F., Rachevski, A., Zampa, G., Zampa, N., Feroci, M., Pohl, M., Vacchi, A.Volume:
10
Langue:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/10/05/p05002
Date:
May, 2015
Fichier:
PDF, 317 KB
english, 2015