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Reliability analysis of electrical engineering power semiconductor devices
Kuznetsov, G. V., Kravchenko, E. V., Pribaturin, N. A.Volume:
87
Langue:
english
Journal:
Russian Electrical Engineering
DOI:
10.3103/S106837121604009X
Date:
April, 2016
Fichier:
PDF, 319 KB
english, 2016