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[IEEE 2016 15th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) - Las Vegas, NV, USA (2016.5.31-2016.6.3)] 2016 15th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) - Die stress in stealth dicing for MEMS
Shuai Shao,, Dapeng Liu,, Yuling Niu,, Seungbae Park,Année:
2016
Langue:
english
DOI:
10.1109/itherm.2016.7517595
Fichier:
PDF, 1.03 MB
english, 2016