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[IEEE 2016 IEEE International Nanoelectronics Conference (INEC) - Chengdu, China (2016.5.9-2016.5.11)] 2016 IEEE International Nanoelectronics Conference (INEC) - Radiation hardened by design techniques to mitigating P-hit single event transient
Chen, Yihua, Tang, Minghua, Yan, Shaoan, Zhang, Wanli, Yin, YoulinAnnée:
2016
Langue:
english
DOI:
10.1109/INEC.2016.7589255
Fichier:
PDF, 291 KB
english, 2016