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Development of flaw detection at the factory
Yu. A. Mednikov, I. I. Sergeev, V. T. Biryukov, V. K. BronnikovVolume:
26
Langue:
english
Pages:
2
DOI:
10.1007/bf00740222
Date:
October, 1982
Fichier:
PDF, 205 KB
english, 1982