Effects of Total-Ionizing-Dose Irradiation on SEU- and SET-Induced Soft Errors in Bulk 40-nm Sequential Circuits
Chen, Rong Mei, Diggins, Zachary J., Mahatme, N. N., Wang, Liang, Zhang, En Xia, Chen, Yanran P., Liu, Yi N., Narasimham, Balaji, Witulski, Arthur F., Bhuva, Bharat L., Fleetwood, Dan M.Année:
2016
Langue:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2016.2614963
Fichier:
PDF, 478 KB
english, 2016
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