SPIE Proceedings [SPIE SPIE Astronomical Telescopes + Instrumentation - Edinburgh, United Kingdom (Sunday 26 June 2016)] Optical and Infrared Interferometry and Imaging V - Fast sub-electron detectors review for interferometry
Malbet, Fabien, Creech-Eakman, Michelle J., Tuthill, Peter G., Feautrier, Philippe, Gach, Jean-Luc, Bério, PhilippeVolume:
9907
Année:
2016
Langue:
english
DOI:
10.1117/12.2234143
Fichier:
PDF, 1.13 MB
english, 2016