Analysis of grain structure evolution based on optical measurements of mc Si wafers
Strauch, Theresa, Demant, Matthias, Krenckel, Patricia, Riepe, Stephan, Rein, StefanVolume:
454
Langue:
english
Journal:
Journal of Crystal Growth
DOI:
10.1016/j.jcrysgro.2016.09.009
Date:
November, 2016
Fichier:
PDF, 4.12 MB
english, 2016