
[IEEE 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2016.5.31-2016.6.3)] 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) - High-Throughput Thermal Compression Bonding of 20 um Pitch Cu Pillar with Gas Pressure Bonder for 3D IC Stacking
Xie, Ling, Wickramanayaka, Sunil, Chong, Ser Choong, Sekhar, Vasarla Nagendra, Cereno, Daniel IsmaelAnnée:
2016
Langue:
english
DOI:
10.1109/ectc.2016.343
Fichier:
PDF, 911 KB
english, 2016