
Biaxial stress evaluation in GeSn film epitaxially grown on Ge substrate by oil-immersion Raman spectroscopy
Takeuchi, Kazuma, Suda, Kohei, Yokogawa, Ryo, Usuda, Koji, Sawamoto, Naomi, Ogura, AtsushiVolume:
55
Langue:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.55.091301
Date:
September, 2016
Fichier:
PDF, 754 KB
english, 2016