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The relation of electrical conductivity profiles and modulus data using the example of STO:Fe single crystals: A path to improve the model of resistance degradation
Bayer, Thorsten J.M., Wang, Jian-Jun, Carter, Jared J., Moballegh, Ali, Baker, Jonathon, Irving, Douglas L., Dickey, Elizabeth C., Chen, Long-Qing, Randall, Clive A.Volume:
117
Langue:
english
Journal:
Acta Materialia
DOI:
10.1016/j.actamat.2016.07.024
Date:
September, 2016
Fichier:
PDF, 933 KB
english, 2016