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SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Online image acquisition system of magnet chip surface quality based on asynchronous reset
Wu, Kaihua, Ye, Shenghua, Zhang, Guangjun, Li, Zhengjie, Hu, Shaopeng, Ni, JunVolume:
7511
Année:
2009
Langue:
english
DOI:
10.1117/12.837858
Fichier:
PDF, 363 KB
english, 2009