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SPIE Proceedings [SPIE Lasers and Applications in Science and Engineering - San Jose, CA (Saturday 20 January 2007)] Solid State Lasers XVI: Technology and Devices - Determination of Cr:LiSAF crystals ablation thresholds on the 20 ps regime using a diagonal scan
Samad, Ricardo E., Hoffman, Hanna J., Shori, Ramesh K., Baldochi, Sonia L., Vieira, Jr., Nilson D., Hodgson, NormanVolume:
6451
Année:
2007
Langue:
english
DOI:
10.1117/12.699156
Fichier:
PDF, 537 KB
english, 2007