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SPIE Proceedings [SPIE Defense and Security - Orlando, Florida, USA (Monday 28 March 2005)] Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVI - Uncertainty analysis of the AEDC 7V chamber
Crider, Dustin, Holst, Gerald C., Lowry, Heard, Nicholson, Randy, Mead, KimberlyVolume:
5784
Année:
2005
Langue:
english
DOI:
10.1117/12.600695
Fichier:
PDF, 371 KB
english, 2005