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SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Information Security - Active infrared thermal imaging technology to detect the corrosion defects in aircraft cargo door
Chen, Dapeng, Zhang, Cunlin, Liu, Tiegen, Zhang, Cunlin, Zeng, Zhi, Xing, Chunfei, Li, YanhongVolume:
7512
Année:
2009
Langue:
english
DOI:
10.1117/12.837743
Fichier:
PDF, 5.66 MB
english, 2009