
Fast and slow lifetime degradation in boron-doped Czochralski silicon described by a single defect
Hallam, Brett, Abbott, Malcolm, Naerland, Tine, Wenham, StuartLangue:
english
Journal:
physica status solidi (RRL) - Rapid Research Letters
DOI:
10.1002/pssr.201600096
Date:
June, 2016
Fichier:
PDF, 427 KB
english, 2016