Amorphous Silicon, Flat-Panel, X-ray Detector
Hamer, Okka W., Strotzer, Michael, Zorger, Niels, Paetzel, Christian, Lerch, Klaus, Feuerbach, Stefan, V??lk, MarkusVolume:
39
Langue:
english
Journal:
Investigative Radiology
DOI:
10.1097/01.rli.0000117853.02516.01
Date:
May, 2004
Fichier:
PDF, 423 KB
english, 2004