SPIE Proceedings [SPIE Electronic Imaging 2005 - San Jose, CA (Monday 17 January 2005)] Sensors and Camera Systems for Scientific and Industrial Applications VI - Fault tolerant photodiode and photogate active pixel sensors
Jung, Cory, Blouke, Morley M., Chapman, Glenn H., La Haye, Michelle L., Djaja, Sunjaya, Cheung, Desmond Y. H., Lin, Henry, Loo, Edward, Audet, Yves R.Volume:
5677
Année:
2005
Langue:
english
DOI:
10.1117/12.588041
Fichier:
PDF, 467 KB
english, 2005
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