SPIE Proceedings [SPIE First European Conference on Optics Applied to Metrology - Strasbourg, France (Wednesday 26 October 1977)] 1st European Conf on Optics Applied to Metrology - Photoelasticimetry And Holographic Interferometry: Applications To The Study Of Stresses And Deformations
Monneret, J., Rastogi, P., Spajer, M., Grosmann, Michel H., Meyrueis, PatrickVolume:
136
Année:
1978
Langue:
english
DOI:
10.1117/12.956143
Fichier:
PDF, 7.39 MB
english, 1978