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SPIE Proceedings [SPIE International Conference of Optical Instrument and Technology - Beijing, China (Sunday 16 November 2008)] 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments - Trace H 2 S monitoring based on off-axis integrated cavity output spectroscopy
Yu, Dahai, Sheng, Yunlong, Wang, Yongtian, Li, Xia, Gu, Haitao, Zeng, Lijiang, Gao, Xiumin, Huang, Wei, Zhang, Yu, Ma, Haibo, Ma, Zhiwei, Gao, Pingbo, Zhen, Wenmin, Li, Ying, Qi, Yu, Wen, Luhong, WangVolume:
7156
Année:
2008
Langue:
english
DOI:
10.1117/12.806966
Fichier:
PDF, 302 KB
english, 2008