SPIE Proceedings [SPIE Millimeter and Submillimeter Waves and Applications: International Conference - San Diego, CA (Monday 10 January 1994)] Millimeter and Submillimeter Waves - Characterization of impurity concentration in semiconductors based on the thermal emission measurements
Malyutenko, Volodymyr K., Chernyakhovsky, V. J., Piotrowski, Tadeusz T., Afsar, Mohammed N.Volume:
2211
Année:
1994
Langue:
english
DOI:
10.1117/12.183062
Fichier:
PDF, 610 KB
english, 1994