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SPIE Proceedings [SPIE Semiconductor Conferences - Bay Point, FL (Monday 23 March 1987)] Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices - Infrared-Wavelength Modulation Spectra Of InGaAs Grown By MBE And LPE
Nee, T. W., Cole, T. L., Green, A. K., Hills, M. E., Lowe-Ma, C. K., Rehn, Victor, Glembocki, Orest J., Pollak, Fred H., Song, Jin-JooVolume:
794
Année:
1987
Langue:
english
DOI:
10.1117/12.940905
Fichier:
PDF, 406 KB
english, 1987