SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems - Design and simulation for the bifocal microlens in thick film lithography
Tang, Xionggui, Ye, Tianchun, Han, Sen, Lu, Rongguo, Liao, Jinkun, Kameyama, Masaomi, Hu, Song, Li, Heping, Zhang, Lin, Liu, YongzhiVolume:
7657
Année:
2010
Langue:
english
DOI:
10.1117/12.865995
Fichier:
PDF, 402 KB
english, 2010
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