SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] X-Ray Mirrors, Crystals, and Multilayers - Evaluation of crystal lattice imperfections using reflection x-ray microscope
Kohmura, Yoshiki, Suzuki, Yoshio, Ishikawa, Tetsuya, Dudchik, Yury I., Kolchevsky, Nikolai N., Komarov, Fadei F., Freund, Andreas K., Ishikawa, Tetsuya, Khounsary, Ali M.Volume:
4501
Année:
2001
Langue:
english
DOI:
10.1117/12.448482
Fichier:
PDF, 610 KB
english, 2001
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