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SPIE Proceedings [SPIE Photonics China '98 - Beijing, China (Wednesday 16 September 1998)] Automated Optical Inspection for Industry: Theory, Technology, and Applications II - Automonitoring the status of a mobile microsphere
Yin, Hao, Shi, Baixuan, Li, Caifeng, Huang, Xiao, Wang, JinSong, Ye, ShenghuaVolume:
3558
Année:
1998
Langue:
english
DOI:
10.1117/12.318388
Fichier:
PDF, 213 KB
english, 1998