SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Three-beam x-ray diffraction in crystals with thin strain layers
Borcha, M. D., Kshevetsky, O. S., Tkach, V. M., Angelsky, Oleg V.Année:
2012
Langue:
english
DOI:
10.1117/12.559870
Fichier:
PDF, 716 KB
english, 2012