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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Rough Surface Scattering and Contamination - Modification of the Maxwell-Beard bidirectional reflectance distribution function
Shemano, Wendy C., Lynn, William F., Shemano, Dave, Davis, Thomas A., Chen, Philip T. C., Gu, Zu-Han, Maradudin, Alexei A.Volume:
3784
Année:
1999
Langue:
english
DOI:
10.1117/12.366707
Fichier:
PDF, 1.49 MB
english, 1999