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[IEEE 2015 American Control Conference (ACC) - Chicago, IL, USA (2015.7.1-2015.7.3)] 2015 American Control Conference (ACC) - Finite element model based temperature consensus control for material microstructure
Chengjian Zheng,, Yixuan Tan,, Wen, John T., Maniatty, Antoinette M.Année:
2015
Langue:
english
DOI:
10.1109/acc.2015.7170804
Fichier:
PDF, 991 KB
english, 2015